Capacitance Meter
C HiTester, C, D, large capacitance MLCC Testing, Testing source frequency: 120 Hz or 1 kHz, Measuring time: 2 ms, built-in RS-232C and GPIB interface, BIN function, contact
C HiTester, C, D, large capacitance MLCC Testing, Testing source frequency: 120 Hz or 1 kHz, Measuring time: 2 ms, built-in RS-232C and GPIB interface, BIN function, contact
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